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Instrument name
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Field Emission Scanning Electron Microscope, Carl Zeiss- Sigma
300
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Make
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German
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Model
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Carl Zeiss- Sigma 300
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Technical Specification of the Instrument
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Resolution: 1.0 nm @ 15 kV, 1.6 nm @1kV
Acceleration voltage: 0.02 kV to 30 kV
Magnification level up to 10 lakhs times
Smart EDX EDS analysis system
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Experiments conducted using the Instrument
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Surface morphology and elemental analysis
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Specimen/Sample requirements for the
Instrument
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Sample should be a dry material
Surface morphology and elemental analysis recording
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Outcome of the Instrument
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Probe current: 3pA – 20nA
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Any others
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Digital store with max. resolution of 32768 x 24576 Pixel.
Windows 10 (64 bit)
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